Key features:

• 1300 nm AFM laser avoids interference with UV-VIS-NIR Raman lasers (364–830 nm)
• Independent optical and AFM channels simplify adjustment and enhance vibration stability
• Top and side optical access with high NA objectives (up to 0.7 NA) for full-spectrum confocal imaging
• Automated laser-cantilever-photodiode alignment via integrated SmartSPM system
• High-speed scanning with scanner resonant frequencies >7 kHz (XY) and >15 kHz (Z)
• Flexure-based closed loop scanner with 100×100×15 µm range for high precision and stability
• “Top mode” scanning avoids lateral interaction—ideal for TERS probes
• Sample replacement without removing AFM head improves experimental reliability
• XYZ objective scanners available in top, side, and bottom optical channels for optimal laser-tip alignment
• Built-in Dynamic Force Microscopy (DFM) using phase-locked loop (PLL) for tip-sample force control
• Options for STM, conductive AFM, and SNOM with software-controlled current ranges (1 nA, 100 nA, 10 µA)
• Low-noise conductivity measurements (60 fA noise level) using 1300 nm laser—ideal for photovoltaics
• SNOM with tuning fork feedback and support for advanced nano-optical experiments like apertureless SNOM and near-field fluorescence with femtosecond lasers

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