Key features:

• Correlated AFM-Raman/PL measurements: Perform both AFM and Raman/PL simultaneously or independently on the same sample location
• Multi-scale capability: Macro, micro, and nano analysis in one platform
• SPM imaging modes: Includes AFM, STM, cAFM, KPFM, force mapping, and electrochemical measurements
• Environmental control compatibility: Supports enclosed AFM chamber with temperature, humidity, and atmosphere regulation
• No active vibration isolation needed: High-resonance frequency scanners ensure robust, stable performance
• Fully automated operation: System starts measurements within minutes
• High-efficiency optical collection: Oblique and top-down detection using high NA objectives
• Broad spectral support: UV-VIS-NIR achromatic platform for Raman, PL, and electroluminescence
• Laser and filter versatility: Supports up to 4 internal lasers, 6 filters, and 4-grating turret
• Nanoscale spatial resolution: Down to 10 nm with TERS and TEPL techniques
• Super-low Raman cut-off: Detect frequencies as low as 30 cm⁻¹
• Ultrafast Raman imaging:
• SmartSampling™: Up to 100x faster Raman mapping
• Q-Scan™: Patented lightsheet 3D confocal Raman imaging

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