Bruker Atomic Force Microscope Dimension XR

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Advanced scanning probe microscope system designed for high-resolution nanomechanical, nanoelectrical, and nanoelectrochemical analysis. Enables quantitative measurements in air, fluid, or reactive environments with unmatched spatial resolution. Ideal for materials research, energy studies, and semiconductor characterization at the nanoscale.


Note: The price mentioned above is for reference only. Do not consider it for purchase.

  • Additional Information

    Key features:

    • Hyperspectral electrical and electrochemical imaging with sub-100 nm spatial resolution
    • Proprietary DataCube modes for simultaneous electrical and mechanical mapping at every pixel
    • AFM-nDMA mode for quantitative nanoscale viscoelastic analysis across a wide frequency range

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